| To analyze the genetic effects of yield-related traits in wheat, a total of 114 recombinant inbred lines were derived from a cross between a wheat landrace Anyuehong with high disease resistant, multi-spikelets, and high grain weight and Taichang 29. The wheat 55K SNP array was used for whole genome screening to identify phenotype and perform optimal linear unbiased prediction(BLUP) on seven yield-related traits, including spikelet number, spike length, effective tillering, spikelet grain number, grain number per spike, grain weight per spike, and thousand-grain weight, at three locations for two years. QTL mapping was performed on the phenotype data. A total of 32 QTLs related to wheat yield were detected, with the rate from 4.67% to 24.43% explaining the phenotype variations. Among them, 25 QTLs can explain phenotypic variation rates over 10%, distributed on chromosomes 1A, 2A, 2B, 2D, 3A, 3D, 4A, 4D, 5A, 5D, 6B, 6D, and 7D. Among them, QSLAYH.Sicau-4D.1, located on the 4D chromosome, controls spike length, which was observed at both experimental locations. Meanwhile, it was found that chromosomes 1A, 3A, and 4D individually carry one pleiotropism QTL. Wheat yield traits had abundant genetic variations, and the identified prior alleles have the functions of increasing spikelet number, grain number per spikelet, grain number per spike, grain weight per spike, and thousand-grain weight. |
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